Ultra-high Resolution Transmission Electron Microscopy of Interficial Structures



Determination of atomic configurations in complex compounds via reciprocal space approach by electron beam or/and X-ray diffraction. Imaging and spectroscopic mapping of crystallographic defects by means of sub-angstrom resolved aberration-corrected scanning transmission electron microscopy. Clarification of the heterointerface structure resultant from the fine precipitations in metallic structural materials and composite materials, which provides new-understanding on the fundamental issues in high performance structural materials. Atomic scale mapping of evolution on structure, defect and chemistry of materials under wet conditions. Developing new methodology of quantitative electron microscopy and theoretical modeling, by which precise cognition on the information embedded in the experimental images would be extracted.